The peak detection and the local position average methods can be used to determine the central positions of the bright spots in atomic image.
原子像亮点定位可由像素点灰度峰值检测法或局部像素点灰度平均法完成。
In optics polishing process, the active lap can reshape the profile for fitting the surface of large optical component with different local position and rotating Angle in real time.
能动磨盘在光学抛光时随磨盘移动位置和旋转角度不同而产生不同的变形以实时与大口径被抛光工件表面实现良好的吻合。
应用推荐