The sensitivity for the semiconductor minority carrier lifetime measurement system was determined using microwave photoconductance decay.
对微波光电导法测量半导体少数载流子寿命的测试系统进行灵敏度分析。
The system of fluorescence measurement uses the silicon photosensitive three-electrode tube as the detection of fluorescence signal. The 8031singlechip is used to measure fluorescence lifetime.
荧光信号检测系统，采用硅光敏三极管作为荧光信号探测器，8031单片机来测量荧光寿命。
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