A method of determining an optimum set of testable components in the fault diagnosis of analog linear circuits under K faults hypothesis is presented in the paper.
本文提出了在模拟线性电路故障诊断中k故障假设下一组最优可测试成份确定的方法。
By using the high-k TiTaO dielectric an1d the high work-function ir electrode, we have exhibited a high performance MIM capacitor that meets the ITRS roadmap requirements for analog capacitors.
借由使用高介电常数介电质和高功函数的铱电极，我们达成满足国际半导体技术蓝图所需求性能的高性能金属-绝缘体-金属电容。
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