扫描测试(SCAN)主要有内部扫描(Internal Scan)和边界扫描(Boundary Scan),内部扫描是一种成熟的时序电路DFT技术,而边界扫描是具有JTAG标准的支持在电路板一级对芯片或板上的逻...
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Internal scan is advanced for the difficulty of fixing the state of sequential circuit, can be divided into full-scan and partial-scan.
内部扫描技术是为了克服时序电路由于状态很难确定所导致的测试复杂度而提出的一种技术,可以分为全扫描和部分扫描。
参考来源 - 嵌入式微处理器可测性设计研究与实现·2,447,543篇论文数据,部分数据来源于NoteExpress
With the aid of enhancement scan by conventional SE sequence, the range and the internal structures of the lesions can be manifested clearlier than those in conventional SE sequence.
与增强SE序列相结合,更有利于肿瘤性病变的病变范围、内部结构的显示。
Scan technique and boundary scan technique are the main stream technology of current DFT technique. They can solve the internal testable problems and the connection problems between ICs respectively.
扫描技术和边界扫描技术是目前可测试性设计的主流技术,可分别用来解决芯片内部与芯片之间的可测试性问题。
In some cases, a CT scan is absolutely required - for example, for diagnosing severe head trauma or internal injuries, for acute abdominal pain, or to diagnose an existing cancer.
在有的病例中,CT扫描是绝对必要的,例如为了诊断严重的头部创伤或内部损伤,为了诊断急腹症或者癌症的进展判断。
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