With the development of intergrated circuit, it is difficult to test the complicated circuit quickly and efficaciously used traditional test method.
随着集成电路的发展,传统的测试方法已经很难对复杂电路进行高速有效的测试。
参考来源 - USB接口的边界扫描测试控制器的设计与实现·2,447,543篇论文数据,部分数据来源于NoteExpress
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