With the help of optical microscope (OM) and color metallography, the interface migration and its influencing factors were investigated during vacuum holding process.

用光学显微镜和彩色金相技术，研究了真空保温过程中界面的迁移情况及其影响因素。

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This information is intended to help you understand the implementation costs and potential migration issues that you are likely to encounter based on interface design choices.

这方面的信息可以用来帮助您理解实现成本和您可能遇到的基于接口设计选择而产生的潜在的迁移问题。

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Refers to the graphical user interface (GUI) that interactively performs the migration.

请参阅以交互方式执行迁移的图形用户界面(GUI)。

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