Tip: to test if the small pattern is integrated in the background pattern, you can make its layer invisible and then visible again.

提示：测试对齐背景图案的小图案，可以使这一层隐藏，然后再次可见。

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The invention relates to the test field of integrated circuits and discloses a low power consumption test pattern generator of an integrated circuit and a test method thereof.

本发明涉及集成电路测试领域，公开了一种集成电路的低功耗测试图形生成器及其测试方法。

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