Computers were getting smaller and more powerful due to the development of integrated circuits (ICs) and large scale integration (LSI).
由于集成电路(ICs)和大规模集成(lsi)的开发，计算机变得越来越小、越来越强大。
Thermal management has emerged as a critical issue in the design of integrated circuits (ICs).
热控制是集成电路设计中需要解决的关键问题。
The principle and operational procedure of Integrated Circuits (ICs) screening with irradiation-and-anneal and multicomponent regression analysis are discussed.
讨论了用辐射-退火法和多元回归分析法对集成电路进行筛选的基本原理和步骤。
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