Tip sample distance control system is the key part of scanning near field infrared microscopy.

针尖样品的距离控制系统是扫描近场红外显微镜的重要组成部分。

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The surface of the wear scar was analyzed by scanning electron microscopy (SEM), X-ray photoelectron spectroscopy (XPS) and Fourier infrared spectroscopy (IR).

采用扫描电子显微镜(sem)、X射线光电子能谱仪(XPS)、傅立叶红外光谱仪(IR)对盘上磨痕进行表面分析。

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Then their structures and composing are analyzed by Fourier transform infrared spectroscopy(FT-IR), X-ray diffraction(X-RD), scanning electron microscopy(SEM).

红外光谱、X-射线衍射、扫描电镜分析其结构与组成，对膜进行降解性、溶涨性和兔眼生物相容性实验研究。

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These tools span much of the electromagnetic spectrum from X-rays to ultraviolet to the infrared - and of course microscopy with visible light.

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