Errors induced by imperfections are far less problematic thanks to the development of a new receiver that detects the whole electrical field of the signal, rather than just its intensity.
微小缺陷引起的错误就不再是个太大的问题,这多亏了能够探测信号的全部而不是只有强度的新接收器的发明。
In induced polarization method, multi-frequency relative phase spectrum method use above signal as field source, showed the advantage of PRMF signal used as field source for electrical exploration.
多频激电相对相位谱法采用上述信号作为场源,充分反映了该信号作为电法勘探场源的优点。
This paper analyzes and discusses some structure's features on the surface of silicon by atomic force microscope (AFM) electrical field induced oxidation.
文中对原子力显微镜(afm)电场诱导硅氧化结构的部分形状特征进行了分析和讨论。
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