With the continual improvement of the chip's integration level and complexity of print circuit board, the application of boundary scan test technology becomes wider and wider in testing ICs.
随着芯片集成度和印刷电路板复杂度的不断提高，边界扫描测试技术在芯片故障检测中的应用越来越广泛。
Scan technique and boundary scan technique are the main stream technology of current DFT technique. They can solve the internal testable problems and the connection problems between ICs respectively.
扫描技术和边界扫描技术是目前可测试性设计的主流技术，可分别用来解决芯片内部与芯片之间的可测试性问题。
BLE is supported by two different technology implementations: dual mode and single mode ICs.
BLE有两种不同的技术实现方式：双模和单模芯片。
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