With the continual improvement of the chip's integration level and complexity of print circuit board, the application of boundary scan test technology becomes wider and wider in testing ICs.

随着芯片集成度和印刷电路板复杂度的不断提高，边界扫描测试技术在芯片故障检测中的应用越来越广泛。

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Scan technique and boundary scan technique are the main stream technology of current DFT technique. They can solve the internal testable problems and the connection problems between ICs respectively.

扫描技术和边界扫描技术是目前可测试性设计的主流技术，可分别用来解决芯片内部与芯片之间的可测试性问题。

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BLE is supported by two different technology implementations: dual mode and single mode ICs.

BLE有两种不同的技术实现方式：双模和单模芯片。

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As the leading provider of power management ICs, including battery management and power supply technology, TI relies on power design expertise to drive innovations in wireless charging.

ENGADGET: TI details the wireless power chip in the Lumia 920, offers four times the charging area