Digital IC Test 数字集成电路测试功能
IC test board 内置试验板
IC Test Engineer 芯片测试工程师
IC test instrument 集成电路测试仪
IC Test and Burn-In Socket 老化测试座
Memory IC Test Systems 内存芯片测试系统
IC Engine Test Technology 内燃机测试技术
IC test model IC测试模式
DC parametric testing is an important component of IC test, it has got more attention from IC test industry, because it could detect the performance of the IC quickly and efficiently.
直流参数测试是集成电路测试技术的重要组成部分，能够快速有效的检测芯片的性能，受到集成电路测试行业的高度重视。
Delay line is a key component of IC test system.
延迟线是集成电路测试系统的关键部件。
This paper introduces the verification method of ASL3000 IC test system.
介绍了ASL3000集成电路测试系统的检定方法。
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