The X-ray diffraction (XRD), high-resolution transmission electron microscopy (HRTEM) and selected area electron diffraction (SAED) results indicate that the sputtered film has an amorphous structure.
射线衍射(XRD)、高分辨率透射电镜(HRTEM)和选区电子衍射(SAED)分析表明，该薄膜为非晶态。
The crystal structure and morphology of the as-synthesized product were characterized by X-ray diffractometer, scanning electron microscope and high-resolution transmission electron microscope.
利用X射线衍射仪、扫描电子显微镜和高分辨透射电子显微镜对所得产物的晶体结构和形貌进行了表征。
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