The hot carrier effects (HCE) in deep sub-micron devices has been studied.

对深亚微米器件中热载流子效应(hce)进行了研究。

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The device degradation induced by HCE can be reduced by studying these failure factors to resign the circuits.

通过对这些失效因素的研究并通过一定的再设计手段，可以减少热载流子效应导致的器件退化。

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Amber HCE-relay. Miniature relay for wide applications. 1 form C. Coil voltage 240 V AC. Light emitting diode wired, plug-in. Standard type.

琥珀HCE -继电器。继电器广泛的应用。 1表C线圈电压240伏交流电。有线发光二极管，插件。标准型。

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