在极端情况下,如果固件错误长期未被检测到其存在,那么,就能变成“硬故障(hard errors)”并对器件本身或包含该器件的系统造成破坏。这类问题的常见例子是:中子导致的稳故障把信号导向错误的路径,从而造成短路。
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The typical results show that the effect of disk hard errors must be considered in study on the reliability of RAID.
典型的数字结果表明在磁盘阵列的可靠性研究中必须考虑磁盘硬错的影响。
Single Hard Errors and functional error were observed in SRAMs under proton irradiation. The explanation is reasonable for the relation between SHE and device integration scale.
实验观察到质子也可以导致存储器出现单个位的硬错误和器件功能错误,并对单个位的硬错误与器件集成度的关系提出了合理的解释。
The best we can do is try our best, keep trying when the going gets hard, learn from the errors of our ways, and credit ourselves for doing what works out well.
最好的办法是我们尽力,在情况变难时坚持尝试,用我们自己的方式从错误中学习,在事情获得成效时归功于我们自己。
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