在极端情况下,如果固件错误长期未被检测到其存在,那么,就能变成“硬故障(hard errors)”并对器件本身或包含该器件的系统造成破坏。这类问题的常见例子是:中子导致的稳故障把信号导向错误的路径,从而造成短路。
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The typical results show that the effect of disk hard errors must be considered in study on the reliability of RAID.
典型的数字结果表明在磁盘阵列的可靠性研究中必须考虑磁盘硬错的影响。
Single Hard Errors and functional error were observed in SRAMs under proton irradiation. The explanation is reasonable for the relation between SHE and device integration scale.
实验观察到质子也可以导致存储器出现单个位的硬错误和器件功能错误,并对单个位的硬错误与器件集成度的关系提出了合理的解释。
Memory errors also can be insidious in a way common to few other classes of errors: They're hard to reproduce and symptoms often are difficult to localize in the corresponding source code.
与少数其他类型的常见错误一样,内存错误还是一种隐性危害:它们很难再现,症状通常不能在相应的源代码中找到。
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