This paper presents a high speed test generation method specifically for upper large scale combination circuit (ULSCC) and full scan designed circuit.
针对特大规模组合电路和全扫描设计电路提出了一种高速测试生成方法。
The full text explain in detail with principle of the TCP connection, principle of the WINSOCK, the basic principle of the port scan and the scan method .
全文对TCP建立连接的原理，WINSOCK原理，端口扫描技术的基本原理和扫描方式都进行了比较详细的介绍。
Full-scan design which upgrades the circuit in the controllability and observability greatly reduces the complexity of test generation, which is considered the most effective method of DFT.
全扫描设计通过提升电路的可控制性和可观察性，大大降低了测试生成的复杂度，被认为是最有效的可测性设计方法之一。
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