The four-point probe technology is also faced with more severe challenge simultaneously.
四探针技术也同时面临着新的挑战。
参考来源 - 半导体材料四探针测试仪中的自动控制技术与图象识别技术的应用·2,447,543篇论文数据，部分数据来源于NoteExpress
A new method for measuring sheet resistance of semiconductor using four-point probe has been developed.
本文介绍用四探针技术测量半导体薄层电阻的新方案。
A measurement of resistivity of metal film using four-point probe technique can be used as the general physics experiment.
四探针测量金属薄膜电阻率是当今微电子技术领域中常用的方法。
Figure 4-47 is a diagram of four - point collinear probe setup for resistivity measurements.
图4 - 47是四点同线探针用于电阻率测量的配置图。
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