However, instead of heating the entire sample, the researchers used a hot atomic force microscope (AFM) tip to convert very narrow ribbons, measuring just 12 nm across, into reduced graphene.
然而,研究人员并非采用加热整个样本的方案,而是使用了原子力显微镜(afm)一个加热探针去转换出一条仅有12纳米宽的导电带。
Atomic force microscopy generates very high-resolution images (about 5-nanometer resolution) by “feeling” the surface of a sample with a tiny probe tip.
原子力显微镜是运用一种微小的探针去“感受”样本表面,能得到高分辨率的影像(约5纳米的分辨率)。
But usability tests force you to make assumptions based on a small sample of customers.
但是,可用性测试会驱使你只根据一小部分客户样本来做出假设。
应用推荐