Polarization microscope, scan electronmicroscope and X ray diffractometer are applied separately to view and determine the fabric characteristics and orientated range of flat particles in samples.

本文中应用了偏光显微镜、扫描电子显微镜和X射线衍射仪分别对试样的组构特征及扁平颗粒的定向排列特征作了观察和测定。

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Flat versions allow sediment and particles to sweep past the measurement surface, minimizing risks of abrasion, breakage and coating.

平面型允许沉淀物、微粒掠过测量面，并可把擦伤、损坏和镀膜的危险降到最小。

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A simple method for calculating the interaction force and interaction energy per unit area between two parallel flat plates particles in the case of constant surface potential was presented.

给出了两个平行平板颗粒处在恒电位条件时，相互作用力和相互作用能的简单计算方法。

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