Two main aspects in VLSI testing, fault simulation and test generation, are researched in this dissertation.

本文对VLSI测试中的两个主要问题—故障模拟和测试产生进行了深入的分析和研究。

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This paper describes state transition fault and collapsing of test generation basis of the character of fixed fault.

详细分析了固定故障所反映出的状态变换特征，提出状态变换故障模型以及相对应的测试生成压缩方法；

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The result indicates that the technology manipulates easily and is effective, the fault coverage reaches 90%, it is a feasible test generation technology.

仿真结果表明，该方法操作简单、有效，故障覆盖率达到了90%，是一种很可行的存储器板测试生成方法。

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