XRD and IR microanalysis XRD和IR微观分析
The distributions of composition, phase-and microstructure were examined respectively by using electron probe microanalysis (EPMA), X-ray Diffraction (XRD) and scanning electron microscopy (SEM).
分别用电子探针(EPMA)、X衍射(XRD)和扫描电镜(SEM)查证了其组分、相结构和显微结构的梯度分布。
Phases constitution, microstructure and element distribution of the coating were studied by X-ray diffraction(XRD), scanning electron microscope(SEM) and electron probe microanalysis(EPMA).
通过X射线衍射分析(XRD)、扫描电镜(SEM)等观察分析了复合粉涂层表面形貌,分析了表面微裂纹和孔隙的形成过程。
应用推荐