XPS surface structure analysis XPS表面结构分析
SEM analysis showed that the crystal structure of a good size is about 200 nm or so, XPS analysis showed the traces of manganese, near-ideal theory.
SEM分析表明其晶体结构良好，粒径大约在200纳米左右，XPS分析表明含有微量的三价锰，近乎于理想的理论计算。
Through the analysis on the surface structure by TG and XPS, it has been confirmed that the PMMA layer is presence and it formed chemical bond between the...
通过差热分析(TG)、光电子能谱(XPS)对片状铝粉表面结构进行分析，得出铝粉颗粒表面确实存在PM MA的包覆层且PM MA与铝粉颗粒是以化学键作用相结合。
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