The two main techniques that are discussed in this book are the x-ray fluorescence spectroscopy (XRF) and the x-ray fine structure analysis (XAFS).
被在这本书里讨论的两种主要技术是X光莹光分光学(XRF)和X光好的架构分析(XAFS)。
The sensitivity of total reflection X ray fluorescence analysis (TXRF) is higher than normal X ray fluorescence analysis (XRF).
全反射荧光分析(TXRF)比常规荧光分析(XRF)具有更高的灵敏度。
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