The product of FSP is characterized by transmission electron microscopy (TEM) and X-ray powder diffractometer (XRD).

通过透射电镜(tem)和x -射线衍射仪(XRD)对所得片状银粉产物进行了表征。

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METHODS: Study on the microstructure of Indigo Naturals with scanning electron microscope (SEM) and X ray diffractometer (XRD) were carried out.

方法：通过扫描电子显微镜(sem)和x衍射(XRD)方法，对青黛的微观结构进行了研究。

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The structural properties of the films were analyzed by X ray photo electron spectroscopy (XPS), X ray diffractometer (XRD) and atomic force microscope (AFM).

使用X射线光电子能谱仪(XPS)、X射线衍射仪(XRD)、原子力显微镜(afm)对薄膜的结构进行了分析。

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