X ray diffraction analysis showed that the layer is an amorphous structure.
射线衍射分析结果显示出镀层为一种非晶态结构。
Its chemical composition and structure are characterized by the chemical analysis, elemental analysis, IR patterns and X-ray powder diffraction.
经元素分析、X -射线粉末衍射、中红外、远红外光谱进行表征，确定了配合物的组成和结构。
X-ray diffraction analysis can be used for analysing the layer structure of aromatic cluster in organic macerals.
射线衍射分析法适宜于分析有机显微组分的芳环层的层状结构。
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