This paper theoretically advances the conception of reverse statistical simulation in the statistical analysis of VLSI, by which a statistical simulator of NMAS digital circuit STANMOS is developed.
本文在理论上提出了逆向统计模拟思想，并用以开发了NMOS数字集成电路统计模拟通用软件——STANMOS。
This study offers a theoretical basis and noise detection method for VLSI circuit components selection, faults diagnosis and localization, and reliability analysis.
这一研究将为VLSI电路器件的严格筛选、故障诊断及定位、VLSI电路的可靠性研究提供新的理论依据和检测方法。
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