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A computer simulation of the transient radiation effect on bipolar integrated circuits is described in this article.
本文介绍了利用计算机模拟双极型集成电路的瞬时辐照效应。
In this paper, a new lumped elements latchup model consisting of four bipolar transistors is used to analyze the latchup effect of CMOS inverters in transient radiation environment.
本文采用较全面的包括四个寄生双极晶体管和MOS管的闩锁模型，详细分析了瞬态辐照下CMOS反相器的闩锁效应。
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