thin-film sample support 样品支撑膜
Inductors without the magnetic thin-film are fabricated as the referential sample using the same processes, in which the structure parameters are consistent with the inductor with magnetic thin-film.
同时,采用相同工艺同批制作了无磁膜微电感作为对比样品,并取各项结构参数与磁膜电感相一致。
Solve the problems existing in the sample of thin film with special shape by using the method of comparing fluorescence X-rays with scattered X-rays and practice the method in FP.
对于异常形状薄膜样品,存在着X射线荧光强度不足、分析位置不固定、定量值偏低的问题。
The system is applicative for any shape of thin film sample including small-size and anomalous shape.
该系统能够满足对任何形状薄膜试片的电阻率测试,包括尺寸较小或者形状不规则的薄膜试片。
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