The thicknesses of the thin films are measured by spectroscopic ellipsometer.
用光谱式椭偏仪对薄膜的厚度进行了测试。
By discussing about the theory and application of MM-16 Liquid Crystal Modulation Ellipsometer, we show the specialty and advantage of MM-16.
通过对新型椭圆偏振光谱仪MM-16原理和应用的研究，浅析MM-16的特点及优势。
This can afford the theoretical and experimental proof for adjusting ellipsometer rapidly.
为迅速调整好椭偏仪提供了理论和实验依据。
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