During the testing of the integrated circuit (404), it communicates in the wafer test mode.
在集成电路(404)的测试过程中，它在晶片测试模式下通信。
In detail, the inventive methodology is based on the use of scan chains being implemented in the integrated circuit for production testing purposes.
具体地，本发明的方法基于实现在集成电路中用于产品测试目的的扫描链的使用。
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