To reduce the storage volume of the test data during the built-in self-test (BIST), a new BIST technique based on two dimensional compression of test data is presented.
为压缩内建自测试(BIST)期间所需测试数据存储容量，提出了一种新的基于测试数据两维压缩的BIST方案。
In order to reduce the volume of IC test data, an index coding compression scheme based on test data partition merging is proposed.
为降低集成电路的测试数据量，提出一种分组合并的索引编码压缩方案。
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