Test engineers can use it to catch memory errors during functional verification and system integration testing.
测试工程师可以利用它获取功能验证和系统整合测试期间的存储错误。
Any extraneous generated currents in the test system will add to the desired current, causing errors.
测试系统中任何额外产生的电流都会加到被测电流中去而引起误差。
In test and measurement system, if the dynamic characteristic of sensors can not meet the requirement, sensors will cause dynamic errors.
在测试系统中，若传感器的动态特性不能达到系统的要求，测量系统就会出现误差。
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