The test compression techniques can be classified to two categories, that is, test stimulus compression and test response compaction.
根据测试数据性质的不同，测试压缩可分为测试激励压缩和测试响应压缩两个方面。
In order to reduce the loss of the fault coverage when using the parity tree to compact the test response, a method of grouping compaction of the output pins is proposed in the paper.
为了减少利用奇偶树压缩测试响应时的故障覆盖损失，提出了一种输出端分组压缩的方法。
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