以上来源于: WordNet
It shall not be possible to touch live parts with the test probe.
该试验探棒应不能触及到带电部件。
The present invention is directed to a test probe having an indexable probe tip.
本发明涉及具有可标引的探针针尖的测试探针。
The utility model relates to a semiconductor test device, in particular to a semiconductor test probe.
本实用新型涉及一种半导体测试器件,尤其是半导体测试探针。
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