The effect of heat treatment on electrical conductivity of Cu based multi-component alloy was studied by metallographic microscope, TEM, SEM/EDS, XRD and conductance instrument.
借助金相显微镜、TEM、SEM/EDS、XRD及电导仪研究了热处理对铜基多元合金导电性能的影响。
The products obtained at different conditions were characterized by means of TEM, SEM, XRD, EDS and the thermal stability of the products was tested.
用TEM、SEM、XRD和EDS等对不同工艺条件下获得的产物进行了表征，对其热稳定性进行了测试。
The microstructure of a Al Si eutectic alloy has been investigated by TEM, SEM and EPMA.
观察分析了铝硅二元共晶合金的显微结构。
应用推荐