The experimental results show that this method is reasonable, and indicate that neglecting surface generation velocity would result in reducing of apparent genera…
并且指出，在表面产生与体产生相比较实际上不能忽略时，忽略表面产生的方法将导致测得的产生寿命低于它的真实值。
The experimental results show that this method is reasonable, and indicate that neglecting surface generation velocity would result in reducing of apparent generation lifetime.
并且指出，在表面产生与体产生相比较实际上不能忽略时，忽略表面产生的方法将导致测得的产生寿命低于它的真实值。
On the basis of this, a method of using twice sweep under different voltage sweep rates for determining both bulk generation lifetime and surface generation velocity is proposed.
在此基础上，建议了一种通过两次不同电压扫描率的线性电压扫描来测定半导体的体产生寿命和表面产生速度的方法。
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