On the base of this method, we propose a TFT-LCD micro defect detection based on the image substraction method and sub-pixel image registration.
在此基础上,提出基于差影法和亚像素级图像配准的TFT-LCD微米级缺陷自动检测算法,实现TFT-LCD微米级缺陷的快速自动检测。
参考来源 - 基于图像处理技术的TFT·2,447,543篇论文数据，部分数据来源于NoteExpress
The image need not pretreatment and the accuracy of registration can reach as high a level as sub-pixel if you registrate image by mutual information method.
互信息的使用使得待配准图像不需要进行预处理，并且配准的精度可以达到亚像素级。
Experimental results indicate that the optimum method has a faster image registration speed and a better image registration precision. The registration results reach the level of sub-pixel.
实验结果表明，此优化方法不仅提高了计算速度，而且提高了配准精度，配准结果达到了亚像素级水平。
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