We propose a novel method to obtain speckle fringe patterns of ESPI from undeformed and deformed speckle patterns.

本文基于变形前和变形后的散斑图，提出一种获得电子散斑干涉条纹图的新颖方法。

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The basic principle of the whole-field analysis of the speckle patterns using a white light source is presented in this paper.

本文叙述了白光源对散斑图进行全场分析的基本原理。提出了对全场等值线位移计算公式。

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During the experiment, the fatigue-loading was paused after fixed fatigue cycle and the white-light speckle patterns were acquired without loading.

在疲劳加载过程中，按一定的疲劳周次在零载荷状态下停机，并采集试件表面上预先制备的白光散斑图。

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