The two multilayers had ordered particles both on planes and in layer by layer, which were confirmed by TEM images and small-angle X-ray diffraction measurement.
这两种多层膜经透射电子显微镜和小角X射线衍射测量证明构成多层膜的单层膜上的纳米金颗粒是有序的，并且颗粒在层与层之间的排列也是有序的。
A simple formula for calculating the interfacial roughness of multilayer by using the small Angle X ray diffraction curves of the samples is given.
提出一个利用多层膜小角X射线衍射谱衍射峰积分强度计算多层膜界面粗糙度的公式。
The small Angle X-ray diffraction and molten viscosity of the adhesives were determined and discussed.
测定了胶粘剂的X光小角衍射和熔融粘度。
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