The method of testing semiconductor RAM in processes on-line condition is highly different from conventional pattern sensitive method.
联机工作情况下对半导体随机存贮器的故障检测和诊断与一般的图案敏化法有显著的不同。
An on-line predicting method of the vibration frequency components that are chosen as the sensitive factors for the faults trend predicting of mechanical parts is put forward.
提出了对机械系统零部件故障进行趋势预测的振动频率分量敏感因子在线预测方法。
The testing results of this method are basically consistent with that of the normal atomic absorption spectrometry using manganese sensitive line as analytical spectral line.
该方法的测定结果与常规灵敏线原子吸收光谱法的测定结果基本一致。
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