Scan Chain Test 扫描链测试技术
For a fixed set of test vectors, the overall test time can be minimized using the scan chain constructed with this method.
对于确定的测试向量集，用该方法构造的扫描链能使电路总的测试时间最少。
For a fixed set of test vectors, the overall test time can be minimized using the scan chain constructed by this method.
对于确定的测试向量集，用该方法构造的扫描链能使电路总的测试时间最少。
A scan test scheme based on scan chain disabling technique has been proposed, which can effectively reduce test power. However, its test application time is long.
一种基于扫描链阻塞技术的扫描测试结构被提出来，该结构有效地降低了测试功耗，但其测试应用时间较长。
应用推荐