X-ray Diffraction(XRD)was applied to study crystalline properties of PLT films, and XRD patterns of PLT thin films show that there appeared(111)preferred-oriented tetragonal perovskite phase.
用X射线衍射技术（XRD）研究了PLT薄膜结晶性能，结果表明PLT薄膜为（111）择优取向钙钛矿相织构。
The crystallization temperature and dielectric properties of PLZT thin films with PLT seeding layers were investigated.
研究了有晶种层的PLZT薄膜的结晶温度及介电性能。
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