The article describes a new method of measuring semiconductor laser spectrum by plane scanning interferometer.
本文描述了用平面扫描干涉仪测量半导体激光光谱的一种新方法。
A method of determining the highness of an ideal object by beam scanning in the vertical plane and amplitude comparison.
提出了一种采用波束扫描与多波束目标幅度比较相结合实现目标高度测定的方法。
There are many methods to measure the pattern of phased array antenna, such as the technique of plane scanning in near field, focusing method in Fresnel zone, general method in far field, etc.
阐述了用聚焦法在菲涅尔区测试相控阵天线的理论依据及实现方法，用实验结果对近远场方向图进行了比较。
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