罗鑫宇 - 机械,电子文档资料 利用4f系统相干成像测量薄膜光学非线性的方法.与Zernike空间滤波实验相反,该方法通过放置在4f系统物面上的一个已知位相物体(Phase Object, PO)来获取放置在频谱面的待测样品的非线性相移信息.与经典的单光束测量薄膜样品三阶光学非线性的Z扫描方法[
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changeable phase object 可变相位物体
phase-object hoography 相物体全息术
pure-phase object 纯相位物体
weak-phase object approximation 弱相位物近似
object phase 目标阶段
Phase object detection 相位物体检测
non-minimum phase object 非最小相位对象
The advantages and disadvantages of the methods are discussed. Second, the interference measurement and scanning imaging technologyfor phase object is propounded.
针对上述的不足，提出了一种位相物体测量与成像的新技术——位相物体干涉测量与扫描成像技术。
参考来源 - 位相物体干涉测量与扫描成像技术研究·2,447,543篇论文数据，部分数据来源于NoteExpress
A pseudo weak phase object approximation to the principle of image formation in high resolution electron microscopy is presented.
本文提出了高分辨电子显微象的赝弱相位物体近似。
The experiment shows that this method is suitable for the measurement of the phase object with the small sectional size and the small temperature gradient.
实验表明此方法适用于几何尺度较小或温度梯度较小的三维位相物体温度场的散斑照相测量。
In the system two coded gratings are inversely imaged to each other by a lens, and the tested phase object is placed between and imaged onto an observation screen.
系统中两块编码光栅用透镜互相成倒像，被测物置于其间并且也用透镜成像于观察屏上。
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