A constraint extraction method and a constraint path delay test generation algorithm are developed.
研究并实现了约束提取及约束下的非强健通路时延测试产生算法。
The test generation algorithm for non-robust path delay fault in combinational circuits is studied.
研究了组合电路中非鲁棒性路径时滞故障的测试生成算法。
The experiments indicate that functional test sets may be able to identify functions whose realizations have low path delay fault coverage.
实验表明，这种功能测试集具有实现低路径延迟故障覆盖范围的功能。
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