However, the existing circuit parallel test generation algorithms fail get good results, especially for sequential circuit.

然而，已有的电路并行测试生成算法并未取得理想的结果，尤其对时序电路。

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The parallel test generation technology is an important method to resolve the difficult problem of test on massive circuits.

并行测试技术是解决当今大规模电路测试难题的一个重要手段。

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Facing the challenge of design scale of VLSI becoming larger, except for circuit parallel, the existing basic parallel approaches cannot solve test generation complexity problems radically.

面对VLSI设计规模日益增大的挑战，除了电路并行以外，其它已有的基本并行策略都无法从根本上解决测试生成的复杂性问题。

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