According to the traditional conception, the shadow moire fringes only give an indication of the large off-plane displacement w.
基于传统的概念，影栅云纹法只能实时获得表征物体大离面位移(深度)的条纹。
Off-plane displacement field on defects can be accurately measured by ESPI. It is fully proved by comparison between experimental results and theoretical results.
理论和实验结果对比表明，利用电子散斑干涉术技术能够精确地测量含缺陷材料表面的离面位移。
Then off-plane displacement field on defects under load of concentrated force was successfully measured by method of electrical speckle pattern of interferometry (ESPI).
同时运用电子散斑干涉方法成功地测量出试件缺陷覆盖层在受到集中力情况下的离面位移。
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