Physical mechanism of the scan blindness occurrence in microstrip phased array is analyzed deeply, and its influence on scanning performance of phased microstrip array is also discussed.

对微带相控阵天线中扫描盲点出现的物理机制进行了深入的分析，并讨论了其对微带相控阵扫描特性的影响。

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Our study shows that the method is useful for rapid designing and analyzing phased array microstrip antennas.

研究表明，这种方法有利于相控微带天线阵的快速设计。

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