inner micro-defect 芯部缺陷
micro-defect interactors 微缺陷相互作用张量
micro bulk defect 微体缺陷
micro pipes defect 微管道缺陷
micro layering defect 显微分层缺陷
micro-environment defect 造血微环境缺陷
A detection method for obtaining the micro bulk defect size in semiconductive materials by analyzing near infrared laser scattering light distribution is presented.
提出了利用近红外激光散射光强分布分析来检测半导体材料内部微体缺陷的检测方法。
The paper analyzed the design defect of Model 2550 micro oxygen analyzer, introduced the modification solution and design principle and attention rule.
分析了原2550型微量氧分析仪采样系统设计缺陷，阐述改造方案和设计原理及使用注意事项。
The basic principle and theoretic model of the detection are introduced. An auto detection system is built and a criterion of micro bulk defect is advanced.
介绍了检测的基本原理和理论模型，以及基于这一构想的全自动检测系统的实现方法，并提出了微缺陷检测的判据。
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